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Texas instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tube | 8 | Scan Test Device with Buffers | Surface Mount | 0°C ~ 70°C | Active | 24-SOIC | 450 | 0 | 1 | 4.5 V ~ 5.5 V |
